Staff Defect Metrology AI/ML Engineer

We are seeking a highly motivated Staff Engineer, Defect Metrology to join our MOCVD team. This role will provide technical leadership in semiconductor defect inspection, data analytics, and development of advanced defect detection and classification capabilities. The ideal candidate combines hands-on semiconductor metrology experience with strong skills in Python, data analysis, image processing, and AI/ML to improve product quality, process control, and manufacturing yield.

Key Responsibilities:

• Develop image-processing algorithms and AI/ML models to detect, classify, and quantify semiconductor defects such as particles, pits, and scratches.
• Analyze large datasets from wafer inspection, metrology, and MOCVD processes to identify trends, correlations, anomalies, and root causes.
• Develop automated analysis and visualization workflows using Python, SQL, JMP, Excel, and related tools.
• Correlate incoming substrate defects with epitaxial defects and develop data-driven methods for substrate quality screening.
• Integrate defect, process, equipment, and wafer-level data to improve understanding of defect mechanisms and yield drivers.
• Partner with process, equipment, and development engineers to correlate defect excursions with process changes and equipment events.
• Improve inspection methodologies, algorithms, calibrations, statistical metrics, and defect classification strategies.
• Ensure the accuracy, repeatability, and integrity of defect metrology systems and associated data.
• Apply DOE, SPC, statistical modeling, and data visualization to support process improvement.
• Communicate technical findings and actionable recommendations to engineering teams, management, vendors, and customers.

Function: Engineering
Experience Level: Mid-Senior Level